19 publications 63

Pascal Nouet received the PhD degree in microelectronics from the University of Mon­tpellier II, France, in 1991. He is currently a full professor in the Electronics Engineering Depart­ment at the University of Montpellier II. He is mentoring or has mentored a total of 19 PhD students and has been the author or coauthor of numerous papers and several patents. Among them, 110 appeared in journals or have been presented in major international confer­ences. From 1987, he has been involved in various research projects such as Electron-Beam Testing of ICs, effect of irradiations on CMOS circuits, characterization and modeling of CMOS devices and inter­connects, and electrostatic discharges in VLSI circuits. His current research interests include the design, test, and reliability of integrated systems including a large variety of heterogeneous systems (MEMS and NEMS). Since 2006, he has also headed the regional CNFM center of Montpellier and the national resource centers of CNFM. He has served as a reviewer of several IEEE journals, and as a referee for public-funded projects in France. He is a member of the IEEE.