Author information pack table of contents

J. Cairney, The University of Sydney, Sydney, New South Wales, Australia
Areas of expertise include, advanced microscopy techniques
F.R. Chen, National Tsing Hua University, Hsinchu, Taiwan
Low dose In-line electron holography, 3D atomic resolution tomography, time-resolution dynamics,
electron optics design for low voltage EM
L. Collins, Oak Ridge National Laboratory Center for Nanophase Materials Sciences, Oak Ridge, Tennessee,
United States of America
Material Science, Atomic Force Microscopy (AFM), Advanced AFM instrumentation and methods,
Energy Materials, Solid Liquid Interfaces, Piezoelectrics, Ion conductors, Photovoltaics
R.F. Egerton, University of Alberta, Edmonton, Alberta, Canada
Analytical Electron Microscopy, Electron Energy-Loss, Spectroscopy, Radiation damage in materials,
Materials Science
H. Engel, University of Basel, Department Biozentrum, Basel, Switzerland
Structural biology, membrane proteins, 2D crystallization, STEM (annular dark field, mass
measurements), electron crystallography, image processing, 3D-EM, atomic force microscopy, single
molecule force spectroscopy, robotics
J. Etheridge, Monash Centre for Electron Microscopy, Clayton, Australia
Theory and development of new electron scattering methods for determining the atomic and electronic
structure of condensed matter.
R. García, Spanish Scientific Research Council, Madrid, Spain
Nanofabrication, Nanolithography, Advanced Dynamic Atomic Force Microscopy, Nanomedicine
P.W. Hawkes, CNRS Western Occitanie Delegation, Paris, France
Electron optics, Electron microscopy, Electron image formation and processing
R. Holmestad, Norwegian University of Science and Technology, Department of Physics, Trondheim, Norway

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AUTHOR INFORMATION PACK 15 Jun 2023
www.elsevier.com/locate/ultramic
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Transmission electron diffraction and microscopy (TEM), Convergent beam electron diffraction
(CBED), Scanning TEM, in relation to inorganic materials – functional and structural.
C. Jacobsen, Northwestern University, Evanston, Illinois, United States of America
X-ray microscopy, X-ray optics, Computational image reconstruction