Fourier Transform Infrared (ft-ir) Spectroscopy Theory and Applications

FT-IR Terms and Definitions

• Scan(s) - a complete cycle of movement of the interferometer mirror. The number of scans collected affects the signal-to-noise ratio (SNR) of the final spectrum. The SNR doubles as the square of the number of scans collected; i.e. 1, 4, 16, 64, 256, ….
• Scan speed or optical path velocity - the rate at which the interferometer mirror moves. For a DTGS detector, the SNR decreases as the scan speed increases.
• Scan range - spectral range selected for the analysis. The most useful spectral range for mid-infrared is 4000 to 400 cm-1.

The highest S/N ratio in the world, 50,000:1 (FT/IR-6300) (Over sampling with 24-bit ADC)
DSP-driven interferometer and new ADC (18-bit to 24-bit)
Digital control of the moving mirror drive using an advanced high speed digital signal processor (DSP) technology
The outstanding performance of the ADC (Analog-to digital converter) and DSP (Digital signal processor) allows very rapid and accurate correction for the effects of velocity and position errors.
Autoalignment for all models (The interferometer optics can always be aligned by the PC)
In addition to proven technology for Rapid scanning and vacuum capabilities;
a Step scan capability enables time-resolved studies similar to research models by Nicolet, Bruker and Bio-Rad.
IR imaging with IMV-4000 multi-channel microscope for all models (Rapid scanning with a linear array MCT detector )
PC communication and control using USB
Aperture of 7.1, 5.0, 3.5, 2.5, 1.8, 1.2, 0.9, 0.5 mm diameter for FT/IR-4100/4200
Spectra Manager II (cross-platform software suite for JASCO spectroscopy systems) (Spectra Manager CFR: 21 CFR Part 11 compliance)
Research model capability (Upgradeable wavelength extension, high resolution, step scan)
Improved Water Vapor and CO2 Compensation
New Features of FTIR4000-6000Series
Polymer shell
Improved instrument design
Compact size
Sample compartment with same size as a higher class model
FT/IR-400 Plus
Aperture
No additional optics for IR microscope interface
Standard apertures for optimum S/N and resolution capability
Easy replacement of light source and detector