Academic Research in Educational Sciences
Volume 4 | Issue 3 | 2023
ISSN: 2181-1385
ISI: 0,967 | Cite-Factor: 0,89 | SIS: 1,9 | ASI: 1,3 | SJIF: 5,771 | UIF: 6,1
540
March, 2023
https://t.me/ares_uz Multidisciplinary Scientific Journal
transition reduces and leads to an increase in the thickness of the conduction part of
the n- layer.
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the temperature sensitivity of a transistor structure in a bipolar mode of measurement-
Journal of Engineering Physics and Thermophysics, 89(2), 514-517,2016.
2. D.R. Dzhuraev, A.A. Turaev. Features of key parameters
of field transistors-
Scientific reports of Bukhara State University, 3 (2), 7-10, 2020.
3. D.R. Djuraev, A.V. Karimov, D.M. Yodgorova, A.A. Turaev.
The Principles Of
Increasing The Sensitivity Of Transistor Structures To External Influences-Euroasian
Journal of Semiconductors Science and Engineering 7(1), 36, 2019.
4. A.V. Karimov, D.R. Djuraev, O.A. Abdulhaev, A.Z.
Rahmatov, Yodgorova, D.
M.,&Turaev, A.A. Tenso properties of field-effect transistors in channel cutoff mode-
International Journal of Engineering Inventions e-ISSN, 2278-7461, 2016.