Author information pack table of contents

N. de Jonge, INM Leibniz Institute for New Materials, Saarbrucken, Germany
H. Kohl, University of Münster, Münster, Germany
G. Kothleitner, Graz University of Technology, Graz, Austria
R. Leapman, National Institutes of Health, Bethesda, Maryland, United States of America
Electron energy loss spectroscopy (EELS) of soft materials, biological scanning transmission electron
microscopy (STEM), electron tomography, Nanomedicine, Serial block face scanning electron
microscopy (SFB-SEM), Focused ion beam (FIB) SEM, Image segmentation using deep learning
B. Legrand, CNRS Laboratory for Systems Analysis and Architecture, Toulouse, France
Micro and nanosystems, Micro and nanotechnology, Optomechanics, atomic force microscopy,
Atomic force spectroscopy, probes, Electromechanical transduction, Optomechanical transduction,
Signal processing, Data processing, Instrumentation
A. Marquis, University of Michigan, Ann Arbor, Michigan, United States of America
Materials Science and Engineering
D. McComb, The Ohio State University, Columbus, Ohio, United States of America
STEM, TEM. EELS, EDX,
P.A. Midgley, University of Cambridge, Cambridge, United Kingdom
D.A. Muller, Cornell University, Ithaca, New York, United States of America
Ptychography, Direct Electron Detectors
J. Neethling, Nelson Mandela University, Port Elizabeth, South Africa
L.-M. Peng, Peking University, Beijing, China
Dynamical diffraction and microscopy related to device applications, Carbon nanotube and graphene
J.M. Plitzko, Max Planck Institute of Biochemistry, Martinsried, Germany
Electron microscopy, cryo-electron tomography, single particle
J.E. Sader, University of Melbourne, Bio21 Molecular Science & Biotechnology Institutes, ARC Centre of
Excellence in Exciton Science, Parkville, Victoria, Australia
T. E. Schäffer, University of Tübingen Institute of Applied Physics, Tübingen, Germany
Scanning probe microscopy, Cell mechanics, Soft matter, biomaterials
D.J. Smith, Arizona State University, Tempe, Arizona, United States of America
Development and applications of atomic-resolution electron microscopy, aberration-corrected
electron microscopy, electron holography