Design and realisation of integrated circuit tester

Mots cles : testeur du circuit integre, microcontroleur
TABLE OF CONTENTS

CERTIFICATION 1
ATTESTATION iii
ACKNOWLEDGEMENTS 5
ABSTRACT 6
RESUME 5
TABLE OF CONTENTS vii
LIST OF ABBREVIATIONS xi
GENERAL INTRODUCTION 1
1.BACKGROUND OF STUDY 1
2.PROBLEM STATEMENT 2
3.MOTIVATION 2
4.OBJECTIVES 2
5.SCOPE OF THE STUDY. 3
6.LIMITATION OF THE STUDY. 3
CHAPTER ONE: LITTERATURE REVIEW 4
INTRODUCTION 4
1.1.SOME EXISTING DOCUMENTARIES ON INTEGRATED CIRCUIT TESTER 4
1.2.EXISTING DIGITAL INTEGRATED CIRCUIT TESTER 6
Figure 1. 3: SU-300 6
FEATURES 6
Features of Linear IC Tester Model 570A 7
1.3.REVIEW OF INTEGRATED CIRCUIT. 8
.3.1. Characteristics of an IC 8
a) Some static characteristics 8
b) Some dynamic characteristics 9
1.4.FAULTS AND TESTING METHODS 10
1.4.1.Why testing the IC? 10
1.4.2.Classification of faults 12
a)Parametric and functional failures 12
b)Static faults 25
c)Dynamic faults 25
1.4.3.Probable Faults Condition 25
a)Bridge faults 25
b)Broken or missing conductor 14
1.4.4.Types of test 14
A.Parametric Test 14
B.Functioning Test 15
a)Exhaustive Method 15
b)Random Method 15
a)Manual test pattern generation 16
b)Pseudo random test pattern generation 16
c)Exhaustive test pattern generation 16
d)Automatic test pattern generation (ATPG) 16
CHAPTER TWO: METHODOLOGY AND MATERIAL 17
2.2.OPERATION OF THE SYSTEM 17
Specifications 18
Transformer 18
Rectifier 19
Filtering and smoothening 19
Regulating 20
2.2.2. The Control Unit 34
> Microcontroller 34
40-pin PDIF 34
Figure 2. 4: Pin description of PIC18F4520 35
Figure 2. 5: The control block 24
Figure 2. 7: Picture of 4X3 Keypad 26
A.THE OPAM 27
B.THE NE555 28
C.LOGIC ICs 28
2.3.1.The ICs to be tested 29
A. Study of logic ICs 29
2.3.2. The Optocoupler 47
Figure 2. 1: (a) picture of optocoupler, (b) the symbol of optocoupler 36
2.5 GENERAL ELECTRONIC DIAGRAM 37
2.5.1 GENERAL FLOWCHART OF THE PROCESS 50
CHAPTER THREE: SIMULATION AND REALIZATION 41
3.3. PRACTICAL CIRCUIT AND RESULTS 58
Figure 3. 6: LCD Displaying Logic IC Good And The Statistics 46
CONCLUSION AND RECOMMENDATION 48
SUMMARY OF CHAPTERS 48
LIMITATIONS 49
RECOMMENDATION 49
FUTURE WORKS 49
GENERAL CONCLUSION 50
REFERENCES 50
APPENDICES 51
APPENDIX 1 51
SOURCE CODE OF THE IC TESTER 51

ix

CERTIFICATION 1
ATTESTATION iii
ACKNOWLEDGEMENTS 5
ABSTRACT 6
RESUME 5
TABLE OF CONTENTS vii
LIST OF ABBREVIATIONS xi
GENERAL INTRODUCTION 1
1.BACKGROUND OF STUDY 1
2.PROBLEM STATEMENT 2
3.MOTIVATION 2
4.OBJECTIVES 2
5.SCOPE OF THE STUDY. 3
6.LIMITATION OF THE STUDY. 3
CHAPTER ONE: LITTERATURE REVIEW 4
INTRODUCTION 4
1.1.SOME EXISTING DOCUMENTARIES ON INTEGRATED CIRCUIT TESTER 4
1.2.EXISTING DIGITAL INTEGRATED CIRCUIT TESTER 6
Figure 1. 3: SU-300 6
FEATURES 6
Features of Linear IC Tester Model 570A 7
1.3.REVIEW OF INTEGRATED CIRCUIT. 8
.3.1. Characteristics of an IC 8
a) Some static characteristics 8
b) Some dynamic characteristics 9
1.4.FAULTS AND TESTING METHODS 10
1.4.1.Why testing the IC? 10
1.4.2.Classification of faults 12
a)Parametric and functional failures 12
b)Static faults 25
c)Dynamic faults 25
1.4.3.Probable Faults Condition 25
a)Bridge faults 25
b)Broken or missing conductor 14
1.4.4.Types of test 14
A.Parametric Test 14
B.Functioning Test 15
a)Exhaustive Method 15
b)Random Method 15
a)Manual test pattern generation 16
b)Pseudo random test pattern generation 16
c)Exhaustive test pattern generation 16
d)Automatic test pattern generation (ATPG) 16
CHAPTER TWO: METHODOLOGY AND MATERIAL 17
2.2.OPERATION OF THE SYSTEM 17
Specifications 18
Transformer 18
Rectifier 19
Filtering and smoothening 19
Regulating 20
2.2.2. The Control Unit 34
> Microcontroller 34
40-pin PDIF 34
Figure 2. 4: Pin description of PIC18F4520 35
Figure 2. 5: The control block 24
Figure 2. 7: Picture of 4X3 Keypad 26
A.THE OPAM 27
B.THE NE555 28
C.LOGIC ICs 28
2.3.1.The ICs to be tested 29
A. Study of logic ICs 29
2.3.2. The Optocoupler 47
Figure 2. 1: (a) picture of optocoupler, (b) the symbol of optocoupler 36
2.5 GENERAL ELECTRONIC DIAGRAM 37
2.5.1 GENERAL FLOWCHART OF THE PROCESS 50
CHAPTER THREE: SIMULATION AND REALIZATION 41
3.3. PRACTICAL CIRCUIT AND RESULTS 58
Figure 3. 6: LCD Displaying Logic IC Good And The Statistics 46
CONCLUSION AND RECOMMENDATION 48
SUMMARY OF CHAPTERS 48
LIMITATIONS 49
RECOMMENDATION 49
FUTURE WORKS 49
GENERAL CONCLUSION 50
REFERENCES 50
APPENDICES 51
APPENDIX 1 51
SOURCE CODE OF THE IC TESTER 51

LIST OF ABBREVIATIONS

• 
  IC: Integrated Circuit
  
• 
  OPAM: Operational Amplifier
  
• 
  LCD: Liquid Crystal Display
  
• 
  TTL: Transistor Transistor Logic
  
• 
  Mcu : Microcontroller unit
  
• 
  pC : Microcontroller
  
• 
  PIC: Programmable Interface Controller
  
• 
  CMOS: Complementary Metal Oxide Semiconductor
  
• 
  ROM : Read Only Memory
  
• 
  RAM : Random Access Memory
  
• 
  NMOS :N-Type Metal Oxide Semi-Conductor
  
• 
  PMOS : P-Type Metal Oxide Semi-Conductor
  
• 
  BJT : Bipolar Junction Transistor
  
• 
  MOSFET : Metal Oxide Semi-Conductor Field Effect Transistor
  
• 
  CU: Control Unit
  
• 
  FLTS : Fault Location Test Set
  
• 
  FDTS : Fault Detection Test Set
  
• 
  ATE : Automatic Testing Equipment
  
• 
  BITS :Built-In Self-Test
  
• 
  ATPG: Automatic test pattern generation
  

GENERAL INTRODUCTION
In any manufacturing industry, there are continuous efforts to reduce cost, upgrade quality and improve overall efficiencies. In electronic industries, with the dramatic increase in circuit complexity and the need for the higher levels of reliability, a major contributor cost in any product can be in the testing. . The purposes of testing is for measurement of defects and quality level and Each integrated circuit that leaves the factory must be thoroughly checked in order to verify it will function as designed However, taking into consideration that, in the real world, no product is perfect, testing will be an essential part of production in the foreseeable future. In industries, research centers and colleges where some common ICs are frequently used; many times have difficulties due to some faults in these integrated circuits. This makes it so essential to test them before using them in hardware implementation. Hence Integrated circuit tester is a good solution for these problems. This tester will be able to test ICs like, logic gates (AND, OR, NAND, EX- OR, NOT, EX-NOR) of 14 pins TTL and CMOS family, some OPAM integrated circuits and NE555.
In this chapter, the background of the problem, motivation, study objectives are outlined.

1. 
   BACKGROUND OF STUDY
   

The dramatic increase in the use of digital integrated circuit (ICs) has created a need for a fast accurate means of testing such ICs. A test of an IC is a process which enables to determine if an IC is functioning properly. In the context of our country, most ICs bought in the market are considered functional. Thereby not subjected to any test before being used in a project. However, the fact that an IC has never been used doesn’t guarantee its functioning properly and it takes a long time to debug and identify a failure in a circuit in which new components have just been introduced. An IC tester is to be economically implemented for small or medium-scale users of such ICs (for example, in the lab, and electronic workshops)
And provides a quick but thorough check of its functions with minimal operator action. The IC tester can be used to test different ICs. The purpose of the IC tester is to ensure IC components are in good condition for use. To test an IC, different hardware circuits for different ICs are needed.
Hence it is needful to construct an IC tester in order to identify and separate healthy components from faulty ones.

2. 
   PROBLEM STATEMENT
   

Integrated Circuits are the main components of each and every electronic circuit and can be used for wide variety and purposes. But sometimes due to faulty IC, the electronic circuit does not work. Since it is tedious work to debug the electronic circuit and to confirm whether it is the circuiting creating the problem or the IC is defective and the degree of the defect. An Integrated Circuit tester is necessary to confirm whether the IC to be used is functioning properly.

3. 
   MOTIVATION
   

The IC testers available in the market today are too costly for individuals to own. Therefore we decided to construct an IC tester which is affordable and user- friendly. The motivation is to build an affordable IC tester which is able to test the functioning of 74 series TTL and CMOS logic gates, including OP Amp integrated circuits, and ICs like NE555. The test sequence provided in the data base facilitates the detection of defective ICs. Furthermore, the tester must be easy to operate, compact, lightweight,
Portable, and low power consumption.
Next, the motivation is to provide an IC tester in portable mode which is easy and convenient to carry around.

4. 
   OBJECTIVES
   

General objectives.
The general objective of this study is to conceive and realize a digital integrated circuit which can test basic ICs such logic gates, OPAM integrated circuits and NE555 timer.
Specific objectives.

• 
  To test 14 pins (2-inputs) logic gates (74xx and 40xx series).
  
• 
  To test NE55 timer and OPAM circuits like lm741 with or without the use of a microcontroller.
  
• 
  To be able to detect the degree of defect found in the logic ICs.
  
• 
  To increase the efficiency of Practicals conducted in the laboratory of H.T.T.T.C. Bambili
  
• 
  To make the realization of circuits in secondary and university institutions easy and reliable.
  

5. 
   SCOPE OF THE STUDY.
   

The tester will be able to:
S Test digital logic gates, specifically basic logic gates (14 pins) with one or two inputs and reveals some relevant information about the circuit.