Design and realisation of integrated circuit tester

CERTIFICATION
I hereby certify that this project entitled “DESIGN AND REALISATION OF INTEGRATED CIRCUIT TESTER” has been carried out by LOBBE JOEL with registration number 15T269 of the option in the Department of Electrical an Power Engineering and of the Higher Technical Teacher Training College (H.T.T.T.C.) Bambili, University of Bamenda.
HEAD OF DEPARTMENT
NAME: Mr. FONYUY DIEUDONNE
Date
Signature
SUPERVISOR
NAME: Mr. TALLA FRANCOIS
CALVIN
Date
Signature
ATTESTATION
We hereby declare that we are the sole authors of this thesis. We authorize the Higher Technical Teacher Training College (H.T.T.T.C.) Bambili to lend this thesis to other institutions or to individuals for the purpose of research because it is a scholar book.
We understand the nature of plagiarism, and we are aware of the University’s policy on this. We certify that this dissertation report is an original work that we present during our University project.
I certify that this dissertation reports original work by use during my University project except for the following:


Date
Signature

Name: LOBBE JOEL
Registration number: 15TO269
DEDICATION
WE DEDICATE THIS WORK TO MY PARENTS
ACKNOWLEDGEMENTS
We thank God the father almighty first of all who gave us the power to conquer all these obstacles during this period in HTTTC Bamenda, and who equally took us through this end of year project in order to write up this present report; and also with the collaboration of a number of persons to whom we express our sincere gratitude:

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  To the administrative body of the University of Bamenda;
  
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  To all the teachers of HTTTC, in particular to the teachers of the department of electrical and power engineering;
  
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  To the Head of Department of Electrical and Power Engineering Mr. FONYUY DIEUDONNE
  
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  To my supervisor Mr. TALLA F. CALVIN, lecturer in ENSET Bambili;
  
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  To Mr. and Mrs. LOBBE for their moral and financial support;
  
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  To Mr. and Mrs. BAU OKHA for their moral, material and financial support;
  
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  To all our brothers and sisters for their financial and moral supports;
  
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  To Mr. and Mrs. ASEK for Their moral, financial and spiritual support;
  
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  To Dr. NDIKUM for his unconditional moral, material and financial support;
  
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  To Mr. DONGWOU ISAAC for his unconditional Spiritual, material and financial support;
  

ABSTRACT
In this present world, with the increase in technology, designing electronic circuits is becoming more complicated, since it involves the use of integrated circuits. Most electronic circuits that
are being designed end up not working because some of the ICs used are faulty. We are interested in making sure that each IC that is to be mounted on an electronic board is functioning properly. Since it’s not easy to test most ICs using a multimeter, there is the need to design a circuit that is able to test Integrated circuits. . The purpose of testing is for measurement of defects and quality level and each integrated circuit must be thoroughly checked in order to verify it will function as designed. Hence this project titled “INTEGRATED CIRCUIT TESTER” is designed to enable electronic circuit designers, vendors of electronic components, even laboratories and schools for example HTTTC Bambili to design workable circuits by making sure that the ICs used are functioning properly. This integrated circuit tester will be able to test 14 pins logic gates ICs of the basic 74xx series and 40xx series of TTL and CMOS respectively( AND,OR,NAND,XOR,XNOR,NOT), OPAM integrated circuits like lm741, AND THE NE555 timer. This IC tester functions without the use of a PC, and uses flexible programmable features of PIC18F4520 microcontroller. This IC tester does the test automatically, tells you the type of IC, whether or not it is functioning properly, and the degree to which the IC is bad in terms of percentage. The OPAM and NE555 can be tested with or without the use of a microcontroller. This IC tester has been successfully built without errors, and we can produce as many as possible.