S Test other integrated circuits like NE555.
S Verify the efficacy of the subject IC by checking the input and output pins individually. This device is designed to work alone or interface with PC.
S Be used in small business establishments that sell electronic components, in schools or other entities.
LIMITATION OF THE STUDY.
This project is limited to designing and implementing an integrated circuit tester for 14pins logic gates ICs (74xx and 40XX series) as illustrated above, for OPAM integrated circuits like LM741, and NE555 timer.
CHAPTER ONE: LITTERATURE REVIEW
INTRODUCTION
In this chapter, we shall study the review on the use and development of DIGITAL INTERGRATED IC TESTER using microcontrollers, similar product done by others, and the various faults that may exist in digital ICs.
SOME EXISTING DOCUMENTARIES ON INTEGRATED CIRCUIT TESTER
After the introduction of an undergraduate digital systems laboratory (Electrical Engineering 249) at the University of Illinois, a need arose for a digital integrated circuit tester. In 1975, this department realized a digital integrated circuit directed by Mr DONALD FARNESS HANSON in collaboration, Mr Eric Strand assembling the unit.
Anindya Bhattacharya, posted a research through “International Journal of Emerging Technology and Advanced Engineering(IEJETAE), on A DIGITAL INTEGRATED CIRCUIT TESTER USING AT89s51 microcontroller capable of testing 14pins integrated circuits of 7400 series in June 2013
Figure 1. 1: block diagram of IC tester using AT89s51.
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