Design and realisation of integrated circuit tester
Download 0.86 Mb.
|
INTEGRATED CIRCUIT TESTER pdf
- Bu sahifa navigatsiya:
- 2.5.2. FLOWCHART OF LOGIC ICs (TTL AND CMOS.)
- Flowchart of NE555 IC test
- 3.1 SIMULATION OF THE CIRCUIT IN PROTEUS
- Figure 3. 2: Continuation of Simulation of Circuits 3.2. PCB PRODUCTION IN ARES
- 4: PCB for power supply
- “initialization
- Figure 3. 6: LCD Displaying Logic IC Good And The Statistics
- Figure 3. 7: LCD displaying results for NE555 and LM741
- Table 3. 1: List of Materials And Cost Estimation CONCLUSION AND RECOMMENDATION
- LIMITATIONS
- RECOMMENDATION
- FUTURE WORKS
- GENERAL CONCLUSION
- APPENDICES APPENDIX 1 SOURCE CODE OF THE IC TESTER
- APPENDIX 2
|
Figure 2. 16: General Electronic Wiring Diagram
2.5. FLOWCHARTS 2.5.1 GENERAL FLOWCHART OF THE PROCESS Figure 2. 17: General Flowchart 2.5.2. FLOWCHART OF LOGIC ICs (TTL AND CMOS.) Figure 2. 18: Flowchart of logic IC test. 2.5.3 FLOWCHART OF NE555 IC Figure 2. 19: Flowchart of NE555 IC test FLOWCHART OF OPAMS (LM741) 20: Flowchart of OPAM IC test. CHAPTER THREE: SIMULATION AND REALIZATION The circuit is being drawn and simulated in Proteus, while the PCB is produced using the Ares software before proceeding to the realization of the circuit. 3.1 SIMULATION OF THE CIRCUIT IN PROTEUS
Figure 3. 1: Simulation of Circuit in Proteus Figure 3. 2: Continuation of Simulation of Circuits 3.2. PCB PRODUCTION IN ARES A. Main Wiring Circuit Figure 3. 3: PCB bottom side for wiring Diagram B. Power Supply aoiиоятэз-ib Ахэмиои 4: PCB for power supply 3.3. PRACTICAL CIRCUIT AND RESULTS Some pictures have been taken during the final realization and testing of the circuit. When the circuit is supplied, the LCD turns ON, displaying “initialization” followed by “INTEGRATED CIRCUIT TESTER”, followed by the number of ICs that it can test, and also the “MAIN MENU” Figure 3. 5: LCD Displaying Main Menu
Using the keypad, we can select the IC which we intend to test. Take for example, we intend to test a logic IC, means we press “1”. And “*” to run test. Figure 3. 6: LCD Displaying Logic IC Good And The Statistics If the IC is good, the green LED comes on, and the LCD also displays good. Pressing “0” gives the statistics of gates. The same procedure is done to test NE555 and LM741.Not forgetting that the NE555 and LM741 can be tested with or without the microcontroller Figure 3. 7: LCD displaying results for NE555 and LM741 Figure 3. 8: Complete Realized Piece 3.4. ESTIMATED COST OF THE REALIZATION OF THE CIRCUIT
Table 3. 1: List of Materials And Cost Estimation CONCLUSION AND RECOMMENDATION SUMMARY OF CHAPTERS Here we shall be talking briefly about the various chapters. That is what each chapter holds as far as this study is concerned. With this said, let us refer back to chapter one which talks about the literature review with regards to our project. In this light, this chapter reviews different techniques proposed by designers in designing an integrated circuit tester, and the other circuit testers found in the market, characteristics of some ICs, types of faults that can exist within an IC and testing methods. Chapter two talks about research methodology and materials as well. Here, we have the block diagram for the whole system and a study of the different constituents of the block diagram that make up our system. It explains all the parts and also giving their functions within the main circuit. It also talks about the main electronic diagram and the flowcharts used for programming. Chapter three talks more on the simulation in the proteus software, Ares and realization of the project proper as well as presentation of results obtained after the realization. We present the various stages for this project and finally the results obtained for the system as a whole. LIMITATIONS Our tester is limited in the following ways: It can test logic ICs that have only two inputs per gate Our tester lacks a computer interface to control it Can test OPAM ICs with only one operational amplifier Due to limited number of pins of our microcontroller, out tester can test only four gates within the NOT IC instead of six. RECOMMENDATION This system can be used in Engineering schools, secondary schools, Electrical and Electronic workshops, Electronic stores and also for personal use. In order to better make use of this project, it is very advisable to check the datasheet of the IC you are to test, so as to get a good mastery of its application. This project is very portable and it enables some ICs like NE555 and OPAM circuits to be tested without a microcontroller. FUTURE WORKS This project has a lot of scope, in the sense that, Including a PC interface could be added to this project, such that it could also be computer controlled. The range of ICs to be tested can also be increased, like other OPAM ICs, regulators because it can only test 2-input logic ICs, NE555 time and OPAM circuits like LM741. Testing other digital ICs like Flip-flops, and more than 2-input logic gates. GENERAL CONCLUSION The aim of this research project was to design and realize a stand-alone integrated circuit tester capable of testing: 2-input logic gates, NE555 timer, and LM741. To test logic ICs, the microcontroller has to be used, because it makes it possible for the job to be done more easily. The NE555 and LM741, can be tested with or without a microcontroller. This project is implemented using PIC18F4520, LCD, keypad and other components. The summary of chapters above presents to us the different stages of this work. We simulated it in proteus and the software used in writing the program code that is to be loaded into the microcontroller is micro basic. This system can be used in Engineering schools, secondary schools, Electrical and Electronic workshops, Electronic stores and also for personal use. REFERENCES Anindya B., “Digital Integrated Circuit Tester”, journal, 2250-2454,ISO9001: VOL.3,ISSUE6 (2013). Sameer D., “Digital Integrated Circuit Tester Using AT89S52”, journal, vol.6, issue 1(2017) Goh S., “Logic Integrated Circuit Tester”, project, (2011) Djounzo R., “Study and Realization of an Improved Computer Controlled Digital IC Tester via USB Port”, project, (2014) Ndoudji L., “Digital Integrated Circuit Tester with Microcontroller”, project, (2017) Jeyavijayan R.,Youngok P., and Ramesh K., “A Fault Analysis Perspective”, (2008) Roy J., Koushanfar F., and Markov I., “EPIC: Ending Piracy of Integrated Circuits”, proceedings of the IEEE/ACM Design, Automation and test in Europe, pp.1069-1074, (2008) Ronald J., Neal S., and Gregory L., “Digital Systems Principles and Applications”, textbook, pp 140-169, (2001) Victor P., Troy H., and Bill D., “digital logic analysis and design”.,10th edition, Englewood Cliffs,N. J. 07632, (1995) Anil K., “digital electronic principles”, John Wiley and sons Ltd, (2007) Thomas L., “electronic devices” ninth edition, Prentice Hall, (2012) FAIRCHILD SEMICONDUCTOR, “Datasheets for logic ICs”, (1986) APPENDICES APPENDIX 1 SOURCE CODE OF THE IC TESTER ' Lcd module connections dim LCD_RS as sbit at RB4_bit LCD_EN as sbit at RB5_bit LCD_D4 as sbit at RB0_bit LCD_D5 as sbit at RB1_bit LCD_D6 as sbit at RB2_bit LCD_D7 as sbit at RB3_bit LCD_RS_Direction as sbit at TRISB4_bit LCD_EN_Direction as sbit at TRISB5_bit LCD_D4_Direction as sbit at TRISB0_bit LCD_D5_Direction as sbit at TRISB1_bit LCD_D6_Direction as sbit at TRISB2_bit LCD_D7_Direction as sbit at TRISB3_bit ' End Lcd module connections dim kp, cnt, oldstate, Num as byte txt as char[7] resA as char[4] resB as char[4] resC as char[4] resD as char[4] percentage as string[3] NOTpercentage as Char[3] dim sMenu as boolean ' define LEDs bit dim LEDBad as sbit at portc.0 LEDGood as sbit at portc.1 LEDUnkown as sbit at porta.5 ' Determine which ic sucket is used dim NOTGateSuckect, Logic2InputsSucket, sItem as integer ' info about gates dim gNOTType, processResults as integer const gateType as Char[8][20] = ("UNIDENTIFIED IC "," 2-INPUTS AND IC "," 2-INPUTS NAND IC "," 2-INPUTS OR IC "," 2-INPUTS NOR IC "," 2-INPUTS XOR IC "," 2-INPUTS XNOR IC ") dim logicType as Char[20] dim curDisplay, LogicStatus,NOTStatus,OPAMPStatus,NE555Status, h as integer Gates as integer[4] ' determine bad Gates NOTgate as integer[4] ' Keypad module connections dim keypadPort as byte at PORTD ' End Keypad module connections dim df as Char[18] end if Delay_ms(20) end select case 35 sMenu = false sItem = 0 INITLED() Displaymenu1() DisplayStatistics() case else end select end select wend end. APPENDIX 2 PICTURES TAKEN DURING THE REALIZATION PROCESS Download 0.86 Mb. Do'stlaringiz bilan baham: 
| ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||