Fig : Gate induced drain leakage
8. Body bias effect:
Body effect refers to the change in the threshold voltage of the device when there is a difference
between substrate(body) and source voltages. Body bias is usually the lowest voltage in the chip.
However, if we were to connect Vbuilt to a voltage lower than VSS (Source voltage), there is an
increased flow of carriers between these source-bulk junctions thereby increasing the width of
the depletion region. This in turns increases the minimum gate voltage needed to achieve
channel inversion
.
9. Velocity saturation:
As there exists drain’s depletion region over the channel region due to the presence of V
DS
the
electric field saturates the mobility of electrons at the pinch off point thereby creating saturation
of current before the device could enter into the saturation region.
V
DS
< V
DSsat
Due to the existence of saturation prior to the V
DSsat
the saturation of the device is extended and
the drain current is small.
Fig 7: Velocity saturation curve
USEFUL FORMULAS
⮚ Formulas
1. Resistance
R =
ρ
L/A
2. Conductivity
σ
= neµ
3. Capacitance
C = dq/dv
4. Oxide capacitance
C
ox
=
ε
ox
/t
ox
5. Diffusion charge density
J
diffusion
= qD
n
Δ
n
6. Drift charge density
J
drift
= qµnE
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