Oxygen in Silicon Single Crystals


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Oxygen in Silicon Single Crystals ццц

Griffin J. A, Navarro H., Genzel L. The Study of Oxygen Thermal Donors in Sili­con by Photothermal lonization Spectroscopy // In: Oxygen, Carbon, Hydrogen and Nitrogen in Silicon, edited by S. J. Pearton, J. W.Corbett , J. C. Mikkelsen, Jr., S. J. Pennycook (Materials Research Society, Pittsburg, 1986). -P. 139-145.

  • Но L. T., Ramdas A. K. Excitation Spectra and Piezospectroscopic Effects of Magnesium Donors in Silicon // Phys. Pev. B.-1972.-V.5, N 2.-P. 462-474.

  • Bekman H. H. P. Th., Gregorkiewicz Т., van Wezep D. A., Ammerlaan C. A. J.

    Electron-Paramagnetic-Resonance Study of Heat-Treatment Centers in p-Type Silicon // J. Appl. Phys.-1987.-V.62, N 11 .-P. 4404-4405.

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    2. Wagner P., Gottshalk H., Trombetta J., Watkins G. D. Preferential Alignment of Thermal Donors in Silicon // In: Proceedings of 14-th international Conference on Defects in Semiconductors, edited by H. J. von Bardeleben (Trans Tech, Aedermannsdorf, Switzerland, 1986).-P. 961-965.

    3. Michel J., Niklas J. R., Spaeth J.-M., Weinert C. Thermal Donors in Silicon: A Study with ENDOR // Phys. Rev. Lett.-1986.-V.57, N 5.-P. 611-614.

    4. Feher G., Hensel J. C., Gere E. A. Paramagnetic Resonance Absorption from Acceptors in Silicon // Phys. Rev. Lett.-1960.-V.5, N 7.-P. 309-311.

    5. Ковальчук В. Б. Исследование электрически активных кислородных ком­плексов в термообработанном кремнии. - Диссертация канд. физ.-мат. наук. - Киев, 1987.-156 с.

    6. Babich V. M., Baran N. P., Bugai A. A., Konchits A. A., Kovalchuk V. B., Mak­simenko V. M., Shanina B. D. Electrical and Paramagnetic Properties of Ther- modonors-II in Silicon. Discussion of a Model // Phys. Stat, Sol. (a).-1988. -V.109, N 2.-P. 537-547.

    7. Wezep D. A., Gregorkiewicz Т., Bekman H. H. P. Th., Ammerlaan C. A. J. Oxy­gen ENDOR of Thermal Donors in Silicon // In: Proceedings of 14-th interna­tional Conference on Defects in Semiconductors, edited by H. J. von Bardele­ben (Trans Tech, Aedermannsdorf, Switzerland, 1986).-P. 1009-1014.

    8. Gregorkiewicz Т., Bekman H. H. P. Th, Ammerlaan C. A. J. Microscopic Struc­ture of the NL10 Heat-Treatment Center in Silicon: Study by Electron-Nuclear Double Resonance // Phys. Rev. B.-1988.-V.38, N 6.-P. 3998-4015.

    9. Бабич В. М., Баран Н. П., Бугай А. А., Зотов К. И., Ковальчук В. Б., Макси­менко В. М. Исследование свойств термодоноров-I в кремнии n-типа при электронном облучении // ФТП.-1986.-Т. 20, Вып. 11.-C. 2117-2119.

    10. Wertheim G. K. Energy Levels in Electron-Bombarded Silicon // Phys. Rev. -1957.-V.105, N 6.-P. 1730-1735.


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